화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Majority carrier capture rates for transition metal impurities in germanium
Lauwaert J, Clauws P
Thin Solid Films, 518(9), 2330, 2010
2 What Do We Know about Hydrogen-Induced Thermal Donors in Silicon?
Simoen E, Huang YL, Ma Y, Lauwaert J, Clauws P, Rafi JM, Ulyashin A, Claeys C
Journal of the Electrochemical Society, 156(6), H434, 2009
3 Point-defect generation in ni-, pd-, and pt-germanide Schottky barriers on n-type germanium
Simoen E, Opsomer K, Claeys C, Maex K, Detavernier C, Van Meirhaeghe RL, Clauws P
Journal of the Electrochemical Society, 154(10), H857, 2007
4 Study of thin film CuInS2-on-Cu-tape (CISCuT) solar cells using deep level transient spectroscopy (DLTS)
Van Gheluwe J, Clauws P
Thin Solid Films, 515(15), 6256, 2007
5 A photoluminescence and structural analysis of CuInS2-on-Cu-tape solar cells (CISCuT)
Van Gheluwe J, Versluys J, Poelman D, Verschraegen J, Burgelman M, Clauws P
Thin Solid Films, 511, 304, 2006
6 Impact of direct plasma hydrogenation on thermal donor formation in n-type CZ silicon
Rafi JM, Simoen E, Claeys C, Huang YL, Ulyashin AG, Job R, Versluys J, Clauws P, Lozano M, Campabadal F
Journal of the Electrochemical Society, 152(1), G16, 2005
7 Photoluminescence study of polycrystalline CdS/CdTe thin film solar cells
Van Gheluwe J, Versluys J, Poelman D, Clauws P
Thin Solid Films, 480, 264, 2005
8 Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy
De Gryse O, Clauws P, Vanhellemont J, Lebedev OI, Van Landuyt J, Simoen E, Claeys C
Journal of the Electrochemical Society, 151(9), G598, 2004
9 Deep levels in oxygenated n-type high-resistivity FZ silicon before and after a low-temperature hydrogenation step
Simoen E, Claeys C, Job R, Ulyashin AG, Fahrner WR, Tonelli G, De Gryse O, Clauws P
Journal of the Electrochemical Society, 150(9), G520, 2003
10 Chemical surface passivation of low resistivity p-type Ge wafers for solar cell applications
Poelman D, Clauws P, Depuydt B
Solar Energy Materials and Solar Cells, 76(2), 167, 2003