화학공학소재연구정보센터
검색결과 : 19건
No. Article
1 Etching of ruthenium coatings in O-2- and Cl-2-containing plasmas
Hsu CC, Coburn JW, Graves DB
Journal of Vacuum Science & Technology A, 24(1), 1, 2006
2 Vacuum beam studies of fluorocarbon radicals and argon ions on Si and SiO2 surfaces
Kimura Y, Coburn JW, Graves DB
Journal of Vacuum Science & Technology A, 22(6), 2508, 2004
3 Fundamental beam studies of radical enhanced atomic layer deposition of TiN
Greer F, Fraser D, Coburn JW, Graves DB
Journal of Vacuum Science & Technology A, 21(1), 96, 2003
4 C4F8 dissociation in an inductively coupled plasma
Radtke MT, Coburn JW, Graves DB
Journal of Vacuum Science & Technology A, 21(4), 1038, 2003
5 Plasma-surface interactions
Chang JP, Coburn JW
Journal of Vacuum Science & Technology A, 21(5S), S145, 2003
6 Fundamental beam studies of deuterium and fluorine radical reaction kinetics on surfaces
Greer F, Fraser D, Coburn JW, Graves DB
Journal of Vacuum Science & Technology B, 21(4), 1391, 2003
7 Deuterium and fluorine radical reaction kinetics on photoresist
Greer F, Coburn JW, Graves DB
Journal of Vacuum Science & Technology B, 20(1), 145, 2002
8 Argon and oxygen ion chemistry effects in photoresist etching
Greer F, Van L, Fraser D, Coburn JW, Graves DB
Journal of Vacuum Science & Technology B, 20(5), 1901, 2002
9 Measurements of neutral and ion composition, neutral temperature, and electron energy distribution function in a CF4 inductively coupled plasma
Singh H, Coburn JW, Graves DB
Journal of Vacuum Science & Technology A, 19(3), 718, 2001
10 Appearance potential mass spectrometry: Discrimination of dissociative ionization products
Singh H, Coburn JW, Graves DB
Journal of Vacuum Science & Technology A, 18(2), 299, 2000