화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Repetitive patterns in rapid optical variations in the nearby black-hole binary V404 Cygni
Kimura M, Isogai K, Kato T, Ueda Y, Nakahira S, Shidatsu M, Enoto T, Hori T, Nogami D, Littlefield C, Ishioka R, Chen YT, King SK, Wen CY, Wang SY, Lehner MJ, Schwamb ME, Wang JH, Zhang ZW, Alcock C, Axelrod T, Bianco FB, Byun YI, Chen WP, Cook KH, Kim DW, Lee T, Marshall SL, Pavlenko EP, Antonyuk OI, Antonyuk KA, Pit NV, Sosnovskij AA, Babina JV, Baklanov AV, Pozanenko AS, Mazaeva ED, Schmalz SE, Reva IV, Belan SP, Inasaridze RY, Tungalag N, Volnova AA, Molotov IE, de Miguel E, Kasai K, Stein WL, Dubovsky PA, Kiyota S, Miller I, Richmond M, Goff W, Andreev MV, Takahashi H, Kojiguchi N, Sugiura Y, Takeda N, Yamada E, Matsumoto K, James N, Pickard RD, Tordai T, Maeda Y, Ruiz J, Miyashita A, Cook LM, Imada A, Uemura M
Nature, 529(7584), 54, 2016
2 Chemical Mechanical Planarization: Slurry Chemistry, Materials, and Mechanisms
Krishnan M, Nalaskowski JW, Cook LM
Chemical Reviews, 110(1), 178, 2010
3 Capillary sodium dodecyl sulfate-DALT electrophoresis with laser-induced fluorescence detection for size-based analysis of proteins in human colon cancer cells
Hu S, Jiang J, Cook LM, Richards DP, Horlick L, Wong B, Dovichi NJ
Electrophoresis, 23(18), 3136, 2002
4 Capillary sodium dodecyl sulfate-DALT electrophoresis of proteins in a single human cancer cell
Hu S, Zhang L, Cook LM, Dovichi NJ
Electrophoresis, 22(17), 3677, 2001
5 The effects of post chemical mechanical planaization buffing on defect density of tungsten and oxide wafers
Shen JJ, Costas WD, Cook LM, Farber J
Journal of the Electrochemical Society, 145(12), 4240, 1998
6 Nonparticulate Origins of Light Point-Defects on Polished Silicon-Wafers
Shen JJ, Cook LM, Pierce KG, Loncki SB
Journal of the Electrochemical Society, 143(6), 2068, 1996