검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
The role of multiple damaged layers at the Si/SiO2 interface on the dielectric breakdown of MOS capacitors Sombra SS, Costa UMS, Freire VN, de Vasconcelos EA, da Silva EF Applied Surface Science, 190(1-4), 35, 2002 |
| No. | Article |
|---|---|
| 1 |
The role of multiple damaged layers at the Si/SiO2 interface on the dielectric breakdown of MOS capacitors Sombra SS, Costa UMS, Freire VN, de Vasconcelos EA, da Silva EF Applied Surface Science, 190(1-4), 35, 2002 |