검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Depth profiling of organic materials using improved ion beam conditions Cramer HG, Grehl T, Kollmer F, Moellers R, Niehuis E, Rading D Applied Surface Science, 255(4), 966, 2008 |
| 2 |
Quantification of Metal Trace Contaminants on Si Wafer Surfaces by Laser-SNMS and ToF-SIMS Using Sputter-Deposited Submonolayer Standards Schnieders A, Mollers R, Terhorst M, Cramer HG, Niehuis E, Benninghoven A Journal of Vacuum Science & Technology B, 14(4), 2712, 1996 |