화학공학소재연구정보센터
검색결과 : 32건
No. Article
1 Optimization of SiGe bandgap-based circuits for up to 300 degrees C operation
Thomas DB, Najafizadeh L, Cressler JD, Moen KA, Lourenco N
Solid-State Electronics, 56(1), 47, 2011
2 Application of advanced 200 GHz Si-Ge HBTs for high dose radiation environments
Praveen KC, Pushpa N, Prabakara YP, Govindaraj G, Cressler JD, Prakash APG
Solid-State Electronics, 54(12), 1554, 2010
3 Low-frequency noise in buried-channel SiGe n-MODFETs
Madan A, Cressler JD, Koester SJ
Solid-State Electronics, 53(8), 901, 2009
4 Proton-induced SEU in SiGe digital logic at cryogenic temperatures
Sutton AK, Moen K, Cressler JD, Carts MA, Marshall PW, Pellish JA, Ramachandran V, Reed RA, Alles ML, Nju G
Solid-State Electronics, 52(10), 1652, 2008
5 Proton and gamma radiation effects in a new first-generation SiGeHBT technology
Haugerud BM, Pratapgarhwala MM, Comeau JP, Sutton AK, Prakash APG, Cressler JD, Marshall PW, Marshall CJ, Ladbury RL, El-Diwany M, Mitchell C, Rockett L, Bach T, Lawrence R, Haddad N
Solid-State Electronics, 50(2), 181, 2006
6 CMOS reliability issues for emerging cryogenic Lunar electronics applications
Chen TB, Zhu CD, Najafizadeh L, Jun B, Ahmed A, Diestelhorst R, Espinel G, Cressler JD
Solid-State Electronics, 50(6), 959, 2006
7 Analysis and understanding of unique cryogenic phenomena in state-of-the-art SiGeHBTs
Liang QQ, Krithivasan R, Ahmed A, Lu Y, Li Y, Cressler JD, Niu GF, Rieh JS, Freeman G, Ahlgren D, Joseph A
Solid-State Electronics, 50(6), 964, 2006
8 An investigation of the effects of radiation exposure on stability constraints in epitaxial SiGe strained layers
Chen TB, Sutton AK, Haugerud BM, Henderson W, Prakash APG, Cressler JD, Doolittle A, Liu XF, Joseph A, Marshall PW
Solid-State Electronics, 50(7-8), 1194, 2006
9 On the geometrical dependence of low-frequency noise in SiGeHBTs
Zhao EH, Cressler JD, El-Diwany M, Krakowski TL, Sadovnikov A, Kocoski D
Solid-State Electronics, 50(11-12), 1748, 2006
10 Gamma and Proton Irradiation Effects on 4H-SiC Depletion-Mode Trench JFETs
Merrett JN, Williams JR, Cressler JD, Sutton A, Cheng L, Bondarenko V, Sankin I, Seale D, Mazzola MS, Krishnan B, Koshka Y, Casady JB
Materials Science Forum, 483, 885, 2005