화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 157 nm: Deepest deep-ultraviolet yet
Rothschild M, Bloomstein TM, Curtin JE, Downs DK, Fedynyshyn TH, Hardy DE, Kunz RR, Liberman V, Sedlacek JHC, Uttaro RS, Bates AK, Van Peski C
Journal of Vacuum Science & Technology B, 17(6), 3262, 1999
2 Outlook for 157 nm resist design
Kunz RR, Bloomstein TM, Hardy DE, Goodman RB, Downs DK, Curtin JE
Journal of Vacuum Science & Technology B, 17(6), 3267, 1999
3 Nanochannel fabrication for chemical sensors
Stern MB, Geis MW, Curtin JE
Journal of Vacuum Science & Technology B, 15(6), 2887, 1997
4 Profile Control in Dry Development of High-Aspect-Ratio Resist Structures
Stern MB, Palmateer SC, Horn MW, Rothschild M, Maxwell BE, Curtin JE
Journal of Vacuum Science & Technology B, 13(6), 3017, 1995