| 1 |
Standards for surface analysis: ASTM committee E-42 on surface analysis
Czanderna AW
Journal of Vacuum Science & Technology A, 21(4), 973, 2003 |
| 2 |
Accelerated durability testing of electrochromic windows
Tracy CE, Zhang JG, Benson DK, Czanderna AW, Deb SK
Electrochimica Acta, 44(18), 3195, 1999 |
| 3 |
Metal overlayers on organic functional groups of self-assembled monolayers: VIII. X-ray photoelectron spectroscopy of the Ni/COOH interface
Herdt GC, Czanderna AW
Journal of Vacuum Science & Technology A, 17(6), 3415, 1999 |
| 4 |
Durability issues and service lifetime prediction of electrochromic windows for buildings applications
Czanderna AW, Benson DK, Jorgensen GJ, Zhang JG, Tracy CE, Deb SK
Solar Energy Materials and Solar Cells, 56(3), 419, 1999 |
| 5 |
Penetration of deposited Ag and Cu overlayers through alkanethiol self-assembled monolayers on gold
Herdt GC, Jung DR, Czanderna AW
Journal of Adhesion, 60(1), 197, 1997 |
| 6 |
Chromic Mechanism in Amorphous WO3 Films
Zhang JG, Benson DK, Tracy CE, Deb SK, Czanderna AW, Bechinger C
Journal of the Electrochemical Society, 144(6), 2022, 1997 |
| 7 |
Metal Overlayers on Organic Functional-Groups of Self-Organized Molecular Assemblies .7. Ion-Scattering Spectroscopy and X-Ray Photoelectron-Spectroscopy of Cu/CH3 and Cu/COOCH3
Herdt GC, Czanderna AW
Journal of Vacuum Science & Technology A, 15(3), 513, 1997 |
| 8 |
Interactions and Penetration at Metal/Self-Assemble Organic Monolayer Interfaces
Jung DR, Czanderna AW, Herdt GC
Journal of Vacuum Science & Technology A, 14(3), 1779, 1996 |
| 9 |
Metal Overlayers on Organic Functional-Groups of Self-Organized Molecular Assemblies .5. Ion-Scattering Spectroscopy and X-Ray Photoelectron-Spectroscopy of Ag/COOH Interfaces
Herdt GC, Czanderna AW
Journal of Vacuum Science & Technology A, 13(3), 1275, 1995 |
| 10 |
Metal Overlayers on Organic Functional-Groups of Self-Assembled Monolayers .6. X-Ray Photoelectron-Spectroscopy of Cr/COOH on 16-Mercaptohexadecanoic Acid
Jung DR, Czanderna AW
Journal of Vacuum Science & Technology A, 13(3), 1337, 1995 |
