| 1 |
Modeling the time-dependent characteristics of perovskite solar cells
Moeini I, Ahmadpour M, Mosavi A, Alharbi N, Gorji NE
Solar Energy, 170, 969, 2018 |
| 2 |
Ga-doped ZnO films magnetron sputtered at ultralow discharge voltages: Significance of controlling defect generation
Chen YY, Meng FP, Ge FF, Xu GB, Huang F
Thin Solid Films, 660, 840, 2018 |
| 3 |
Hot-electron induced defect generation in AlGaN/GaN high electron mobility transistors
Rao H, Bosman G
Solid-State Electronics, 79, 11, 2013 |
| 4 |
Impact of emitter fabrication on the yield of SiGe HBTs
Heinemann B, Rucker H, Tillack B
Thin Solid Films, 517(1), 71, 2008 |
| 5 |
Investigation of graphite particle inclusions in 6H-SIC single crystals grown by sublimation boule growth technique
Nishiguchi T, Nakamura M, Isshiki T, Ohshima S, Nishino S
Materials Science Forum, 457-460, 47, 2004 |
| 6 |
Model for defect generation at the (100)Si/SiO2 interface during electron injection in MOS structures
Houssa M, Autran JL, Heyns MM, Stesmans A
Applied Surface Science, 212, 749, 2003 |
| 7 |
Current oscillations in thin metal-oxide-semiconductor structures observed by ballistic electron emission microscopy
Wen HJ, Ludeke R, Schenk A
Journal of Vacuum Science & Technology B, 16(4), 2296, 1998 |
| 8 |
Trap Generation in Buried Oxides of Silicon-on-Insulator Structures by Vacuum-Ultraviolet Radiation
Afanasev VV, Stesmans A, Revesz AG, Hughes HL
Journal of the Electrochemical Society, 144(2), 749, 1997 |
| 9 |
Intrinsic and Extrinsic Threshold Voltage Shift Dependence on the Oxide Field-Induced During Optically Assisted Electron Injection
Kim HS, Williams CK, Reisman A
Journal of the Electrochemical Society, 142(3), 979, 1995 |
| 10 |
Silicon-on-Insulator Obtained by High-Dose Oxygen Implantation, Microstructure, and Formation Mechanism
Stoemenos J, Garcia A, Aspar B, Margail J
Journal of the Electrochemical Society, 142(4), 1248, 1995 |
