| 1 |
Characterization of 167 MeV Xe ion irradiated n-type 4H-SiC
Madito MJ, Hlatshwayo TT, Skuratov VA, Mtshali CB, Manyala N, Khumalo ZM
Applied Surface Science, 493, 1291, 2019 |
| 2 |
Improved biodegradability of Fe-Mn alloy after modification of surface chemistry and topography by a laser ablation
Donik C, Kocijan A, Paulin I, Hocevar M, Gregorcic P, Godec M
Applied Surface Science, 453, 383, 2018 |
| 3 |
The extraction of depth profiles from simulated ARXPS data: From parametric models to regularization methods
Palacio C, Camacho G, Garcia-Rodriguez C
Applied Surface Science, 359, 306, 2015 |
| 4 |
Visualization of oxide ionic diffusion at SOFC cathode/electrolyte interfaces by isotope labeling techniques
Horita T, Nishi M, Shimonosono T, Kishimoto H, Yamaji K, Brito ME, Yokokawa H
Solid State Ionics, 262, 398, 2014 |
| 5 |
Glow discharge optical emission spectroscopy: a complementary technique to analyze thin electrodeposited polyaniline films
Moutarlier V, Lakard S, Patois T, Lakard B
Thin Solid Films, 550, 27, 2014 |
| 6 |
The characterization of PEEK, PET and PI implanted with Co ions to high fluences
Mackova A, Malinsky P, Miksova R, Khaibullin RI, Valeev VF, Svorcik V, Slepicka P, Slouf M
Applied Surface Science, 275, 311, 2013 |
| 7 |
Molar concentration-depth profiles at the solution surface of a cationic surfactant reconstructed with angle resolved X-ray photoelectron spectroscopy
Wang CY, Morgner H
Applied Surface Science, 257(6), 2291, 2011 |
| 8 |
Composition depth profiles of Bi3.15Nd0.85Ti3O12 thin films studied by X-ray photoelectron spectroscopy
Zhang ZH, Zhong XL, Liao H, Wang F, Wang JB, Zhou YC
Applied Surface Science, 257(17), 7461, 2011 |
| 9 |
Glow discharge optical emission spectroscopy for accurate and well resolved analysis of coatings and thin films
Wilke M, Teichert G, Gemma R, Pundt A, Kirchheim R, Romanus H, Schaaf P
Thin Solid Films, 520(5), 1660, 2011 |
| 10 |
Structural characterization of nc-Si films grown by low-energy PECVD on different substrates
Le Donne A, Binetti S, Isella G, Pichaud B, Texier M, Acciarri M, Pizzini S
Applied Surface Science, 254(9), 2804, 2008 |
