검색결과 : 148건
| No. | Article |
|---|---|
| 1 |
Temperature dependence of the dielectric function of monolayer MoS2 Le VL, Kim TJ, Park HG, Nguyen HT, Nguyen XA, Kim YD Current Applied Physics, 19(2), 182, 2019 |
| 2 |
Spectroscopic ellipsometry data analysis using penalized splines representation for the dielectric function Likhachev DV Thin Solid Films, 669, 174, 2019 |
| 3 |
Microstructure and opto-electronic properties of Sn-rich Au-Sn diffusive solders Rerek T, Skowronski L, Kobierski M, Naparty MK, Derkowska-Zielinska B Applied Surface Science, 451, 32, 2018 |
| 4 |
A design of selective solar absorber for high temperature applications Al-Rjoub A, Rebouta L, Costa P, Barradas NP, Alves E, Ferreira PJ, Abderrafi K, Matilainen A, Pischow K Solar Energy, 172, 177, 2018 |
| 5 |
Design and characterization of solar absorbing multilayer stack based on Al/Cr-N-O/SiO2 layers Liu J, Sun ZQ, Wang H Solar Energy Materials and Solar Cells, 188, 18, 2018 |
| 6 |
Doping of poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) films studied by means of electrochemical variable angle spectroscopic ellipsometry Pathak G, Krasinska-Krawet Z, Szyk-Warszynska L, Cakara D Thin Solid Films, 651, 31, 2018 |
| 7 |
Temperature-dependent dielectric functions and interband critical points of sulfur-rich TlIn(S(1-x)Sex)(2) layered solid solution crystals Gomonnai OO, Gordan O, Guranich PP, Slivka AG, Gomonnai AV, Zahn DRT Applied Surface Science, 424, 383, 2017 |
| 8 |
Evaluation of the dielectric function of colloidal Cd1-xHgxTe quantum dot films by spectroscopic ellipsometry Bejaoui A, Alonso MI, Garriga M, Campoy-Quiles M, Goni AR, Hetsch F, Kershaw SV, Rogach AL, To CH, Foo Y, Zapien JA Applied Surface Science, 421, 295, 2017 |
| 9 |
Ellipsometric characterization of MoSe2 thin layers obtained by thermal treatment of molybdenum in selenium vapor Bayramov A, Aliyeva Y, Eyyubov G, Mammadov E, Jahangirli Z, Lincot D, Mamedov N Applied Surface Science, 421, 310, 2017 |
| 10 |
Ellipsometric study of the optical response of ZnS:Cr for PV applications Brakstad T, Hope BR, Nematollahi M, Kildemo M, Podraza NJ, Ghimire K, Reenaas TW Applied Surface Science, 421, 315, 2017 |