검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Applications of real-time and mapping spectroscopic ellipsometry for process development and optimization in hydrogenated silicon thin-film photovoltaics technology Dahal LR, Li J, Stoke JA, Huang ZQ, Shan A, Ferlauto AS, Wronski CR, Collins RW, Podraza NJ Solar Energy Materials and Solar Cells, 129, 32, 2014 |
| 2 |
Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si:H photovoltaics Dahal LR, Sainju D, Podraza NJ, Marsillac S, Collins RW Thin Solid Films, 519(9), 2682, 2011 |