검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Postfabrication Resistance Trimming of a Superconducting Tunnel Junction Using a Focused Ion-Beam Barber ZH, Blamire MG, Dawes NJ Journal of Vacuum Science & Technology B, 13(2), 318, 1995 |
| 2 |
Electron-Beam Fabrication and Focused Ion-Beam Inspection of Submicron Structured Diffractive Optical-Elements Dix C, Mckee PF, Thurlow AR, Towers JR, Wood DC, Dawes NJ, Whitney JT Journal of Vacuum Science & Technology B, 12(6), 3708, 1994 |