검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Investigation of process induced defects in SiGe/Si heterojunction bipolar transistors by deep-level transient spectroscopy Souifi A, De Barros O, Bremond G, Le Tron B, Mouis M, Vincent G, Ashburn P Journal of Vacuum Science & Technology B, 16(3), 1745, 1998 |