검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry Franquet A, De Laet J, Schram T, Terryn H, Subramanian V, van Ooij WJ, Vereecken J Thin Solid Films, 384(1), 37, 2001 |
| 2 |
Nondestructive optical characterization of chemical conversion coatings on aluminum Schram T, De Laet J, Terryn H Journal of the Electrochemical Society, 145(8), 2733, 1998 |
| 3 |
Evaluation of interferometric ellipsometer systems with a time resolution of one microsecond and faster Hemmes K, Hamstra MA, Koops KR, Wind MM, Schram T, de Laet J, Bender H Thin Solid Films, 313-314, 40, 1998 |
| 4 |
Non-destructive optical characterisation of chromium conversion layers on aluminium Schram T, De Laet J, Terryn H Thin Solid Films, 313-314, 727, 1998 |
| 5 |
Development of an optical model for steady state porous anodic films on aluminium formed in phosphoric acid De Laet J, Terryn H, Vereecken J Thin Solid Films, 320(2), 241, 1998 |