검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Recent Insights into the Physical Modeling of the Spreading Resistance Point-Contact Clarysse T, Dewolf P, Bender H, Vandervorst W Journal of Vacuum Science & Technology B, 14(1), 358, 1996 |
| 2 |
One-Dimensional and 2-Dimensional Carrier Profiling in Semiconductors by Nanospreading Resistance Profiling Dewolf P, Clarysse T, Vandervorst W, Snauwaert J, Hellemans L Journal of Vacuum Science & Technology B, 14(1), 380, 1996 |
| 3 |
Minimizing the Size of Force-Controlled Point Contacts on Silicon for Carrier Profiling Snauwaert J, Blanc N, Dewolf P, Vandervorst W, Hellemans L Journal of Vacuum Science & Technology B, 14(2), 1513, 1996 |
| 4 |
Lateral and Vertical Dopant Profiling in Semiconductors by Atomic-Force Microscopy Using Conducting Tips Dewolf P, Snauwaert J, Hellemans L, Clarysse T, Vandervorst W, Dolieslaeger M, Quaeyhaegens D Journal of Vacuum Science & Technology A, 13(3), 1699, 1995 |