검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Low temperature growth and physical properties of InAs thin films grown on Si, GaAs and In0.53Ga0.47As template Alcotte R, Martin M, Moeyaert J, Gergaud P, David S, Cerba T, Bassani F, Ducroquet F, Bogumilowicz Y, Baron T Thin Solid Films, 645, 119, 2018 |
| 2 |
Dielectric properties, conductivity and Li+ ion motion in LiPON thin films Le Van-Jodin L, Ducroquet F, Sabary F, Chevalier I Solid State Ionics, 253, 151, 2013 |
| 3 |
Characteristics of molybdenum bilayer back contacts for Cu(In, Ga)Se-2 solar cells on Ti foils Roger C, Noel S, Sicardy O, Faucherand P, Grenet L, Karst N, Fournier H, Roux F, Ducroquet F, Brioude A, Perraud S Thin Solid Films, 548, 608, 2013 |
| 4 |
Magnesium metallic interlayer as an oxygen-diffusion-barrier between high-kappa dielectric thin films and silicon substrate Rauwel E, Rauwel P, Ducroquet F, Sunding MF, Matko I, Lourenco AC Thin Solid Films, 520(17), 5602, 2012 |
| 5 |
Addition of yttrium into HfO2 films: Microstructure and electrical properties Dubourdieu C, Rauwel E, Roussel H, Ducroquet F, Hollander B, Rossell M, Van Tendeloo G, Lhostis S, Rushworth S Journal of Vacuum Science & Technology A, 27(3), 503, 2009 |
| 6 |
Effect of annealing and electrical properties of high-kappa thin films grown by atomic layer deposition using carboxylic acids as oxygen source Rauwel E, Ducroquet F, Rauwel P, Willinger MG, Matko I, Pinna N Journal of Vacuum Science & Technology B, 27(1), 230, 2009 |
| 7 |
Nanoscale leakage current measurements in metal organic chemical vapor deposition crystalline SrTiO3 films Rozier Y, Gautier B, Hyvert G, Descamps A, Plossu C, Dubourdieu C, Ducroquet F Thin Solid Films, 517(6), 1868, 2009 |
| 8 |
Structural and electrical characterizations of yttrium oxide films after postannealing treatments (vol 152, 217, 2005) Durand C, Dubourdieu C, Vallee C, Gautier E, Ducroquet F, Jalabert D, Roussel H, Bonvalot M, Joubert O Journal of the Electrochemical Society, 153(2), L4, 2006 |
| 9 |
On the mobility in high-kappa/metal gate MOSFETs: Evaluation of the high-kappa phonon scattering impact Weber O, Casse M, Thevenod L, Ducroquet F, Ernst T, Deleonibus S Solid-State Electronics, 50(4), 626, 2006 |
| 10 |
Structural and electrical characterizations of yttrium oxide films after postannealing treatments Durand C, Dubourdieu C, Vallee C, Gautier E, Ducroquet F, Jalabert D, Roussel H, Bonvalot M, Joubert O Journal of the Electrochemical Society, 152(12), F217, 2005 |