검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Growth and characterization of broad spectrum infrared emitting GaInAsP/InP heterostructures Rakovics V, Nadas J, Reti I, Ducso C, Battistig G Journal of Crystal Growth, 468, 572, 2017 |
| 2 |
WO3 nano-rods sensitized with noble metal nano-particles for H2S sensing in the ppb range Takacs M, Zambo D, Deak A, Pap AE, Ducso C Materials Research Bulletin, 84, 480, 2016 |
| 3 |
Electrical and optical properties of Si-rich SiN, layers: Effect of annealing Szollosi P, Basa P, Ducso C, Mate B, Adam M, Lohner T, Petrik P, Pecz B, Toth L, Dobos L, Dozsa L, Horvath ZJ Current Applied Physics, 6(2), 179, 2006 |
| 4 |
Microwave-CVD diamond protective coating for 3D structured silicon microsensors Csorbai H, Furjes P, Hars G, Ducso C, Barsony I, Kalman E, Deak P Materials Science Forum, 414-4, 69, 2003 |
| 5 |
The effect of adhesion promoter layer thickness on the adhesion strength between silicone rubber and aluminium Banhegyi G, Ducso C, Lohner T Composite Interfaces, 5(1), 31, 1997 |
| 6 |
Porous Silicon Host Matrix for Deposition by Atomic Layer Epitaxy Utriainen M, Lehto S, Niinisto L, Ducso C, Khanh NQ, Horvath ZE, Barsony I, Pecz B Thin Solid Films, 297(1-2), 39, 1997 |
| 7 |
Deposition of Tin Oxide into Porous Silicon by Atomic Layer Epitaxy Ducso C, Khanh NQ, Horvath Z, Barsony I, Utriainen M, Lehto S, Nieminen M, Niinisto L Journal of the Electrochemical Society, 143(2), 683, 1996 |
| 8 |
Nondestructive Detection of Microvoids at the Interface of Direct-Bonded Silicon-Wafers by Scanning Infrared Microscopy Khanh NQ, Hamori A, Fried M, Ducso C, Gyulai J Journal of the Electrochemical Society, 142(7), 2425, 1995 |