검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Local anodic oxidation by atomic force microscopy for nano-Raman strain measurements on silicon-germanium thin films Kolanek K, Hermann P, Dudek PT, Gotszalk T, Chumakov D, Weisheit M, Hecker M, Zschech E Thin Solid Films, 518(12), 3267, 2010 |