화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Accuracy of Thin-Film Stress Measurements with C-Si Microbeams Fabricated by Dry-Etching
Boutry M, Bosseboeuf A, Bourouina T, Grandchamp JP, Dufourgergam E, Gilles JP
Journal of Vacuum Science & Technology B, 15(5), 1767, 1997
2 Electrical-Properties of Silicon-Nitride Films Grown on a SiGe Layer by Distributed Electron-Cyclotron-Resonance Plasma-Enhanced Chemical-Vapor-Deposition
Dufourgergam E, Meyer F, Delmotte F, Hugon MC, Agius B, Warren P, Dutartre D
Thin Solid Films, 294(1-2), 214, 1997