검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Characterization of silicon oxynitride thin films by x-ray photoelectron spectroscopy Shallenberger JR, Cole DA, Novak SW Journal of Vacuum Science & Technology A, 17(4), 1086, 1999 |
| 2 |
The origin of photoluminescence from alpha-sexithienyl thin films Marks RN, Michel RH, Gebauer W, Zamboni R, Taliani C, Mahrt RF, Hopmeier M Journal of Physical Chemistry B, 102(39), 7563, 1998 |