| 1 |
Electronic properties of electrolyte/anodic alumina junction during porous anodizing
Vrublevsky I, Jagminas A, Schreckenbach J, Goedel WA
Applied Surface Science, 253(10), 4680, 2007 |
| 2 |
Physicochemical characterization of passive films on niobium by admittance and electrochemical impedance spectroscopy studies
Di Quarto F, La Mantia F, Santamaria M
Electrochimica Acta, 50(25-26), 5090, 2005 |
| 3 |
Conditions under which heterogeneous charge-transfer rate constants can be extracted from transient photoluminescence decay data of semiconductor/liquid contacts as determined by two-dimensional transport modeling
Anz SJ, Kruger O, Lewis NS, Gajewski H
Journal of Physical Chemistry B, 102(29), 5625, 1998 |
| 4 |
A Study of Thin Anodic WO3 Films by Electrochemical Impedance Spectroscopy
Biaggio SR, Rochafilho RC, Vilche JR, Varela FE, Gassa LM
Electrochimica Acta, 42(11), 1751, 1997 |
| 5 |
The Ability of a Surface-Charge Approach to Describe Barrier Film Growth on Tungsten in Acidic Solutions
Bojinov M
Electrochimica Acta, 42(23-24), 3489, 1997 |
| 6 |
Semiconductor Properties of Passive Oxide Layers on Binary Tin Plus Indium Alloys
Moina CA, Varela FE, Hernandez LF, Ybarra GO, Vilche JR
Journal of Electroanalytical Chemistry, 427(1-2), 189, 1997 |
| 7 |
Characterization of Anodic Oxide-Films on Sb+bi Alloys in 1 M H3PO4 by Photocurrent and Capacitance Measurements
Bojinov M, Kanazirski I, Girginov A
Journal of Electroanalytical Chemistry, 431(1), 117, 1997 |
| 8 |
A New Method for Estimating the Diffusivities of Vacancies in Passive Films
Sikora E, Sikora J, Macdonald DD
Electrochimica Acta, 41(6), 783, 1996 |
| 9 |
Characterization of Hafnium Oxide-Films Modified by Pt Doping
Esplandiu MJ, Avalle LB, Macagno VA
Electrochimica Acta, 40(16), 2587, 1995 |
| 10 |
Semiconducting Properties of TiO2 Films Thermally Formed at 480-Degrees-C
Camara OR, Depauli CP, Vaschetto ME, Retamal B, Aquirre MJ, Zagal JH, Biaggio SR
Journal of Applied Electrochemistry, 25(3), 247, 1995 |
