화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 Double-layer inorganic antireflective system for KrF lithography
Xu M, Ko TM
Journal of Vacuum Science & Technology B, 18(1), 127, 2000
2 Adhesion-promoted copolymers based on norbornene derivatives and maleic anhydride for 193-nm photoresists
Kim JB, Yun HJ, Kwon YG, Lee BW
Polymer, 41(22), 8035, 2000
3 Sub-100 nm KrF lithography for complementary metal-oxide-semiconductor circuits
Fritze M, Astolfi D, Liu H, Chen CK, Suntharalingam V, Preble D, Wyatt PW
Journal of Vacuum Science & Technology B, 17(2), 345, 1999
4 Multilayer hexamethyldisiloxane film as bottom antireflective coating for ArF lithography
Wang LA, Chen HL
Journal of Vacuum Science & Technology B, 17(6), 2772, 1999
5 Reduction of line edge roughness in the top surface imaging process
Mori S, Morisawa T, Matsuzawa N, Kaimoto Y, Endo M, Matsuo T, Kuhara K, Sasago M
Journal of Vacuum Science & Technology B, 16(6), 3739, 1998
6 Pattern collapse in the top surface imaging process after dry development
Mori S, Morisawa T, Matsuzawa N, Kaimoto Y, Endo M, Matsuo T, Kuhara K, Sasago M
Journal of Vacuum Science & Technology B, 16(6), 3744, 1998
7 Photosensitization of base-developable poly(phenylhydrosilane) with 3,3 ',4,4 '-tetra(tert-butylperoxycarbonyl)benzophenone. Mechanism of the drastic photosensitization in terms of photoinduced electron transfer
Kani R, Nakano Y, Yoshida H, Hayase S
Macromolecules, 31(25), 8794, 1998
8 Poly(Phenylhydrosilane) - Base-Developable Polysilane Resist
Kani R, Nakano Y, Yoshida H, Mikoshiba S, Hayase S
Journal of Polymer Science Part A: Polymer Chemistry, 35(12), 2355, 1997