| 1 |
Controlling refractive index in AlN films by texture and crystallinity manipulation
Giba AE, Pigeat P, Bruyere S, Easwarakhanthan T, Mucklich F, Horwat D
Thin Solid Films, 636, 537, 2017 |
| 2 |
Structural and optical properties of magnetron-sputtered Er-doped AIN films grown under negative substrate bias
Legrand J, Pigeat P, Easwarakhanthan T, Rinnert H
Applied Surface Science, 307, 189, 2014 |
| 3 |
Optical modelling of photoluminescence emitted by thin doped films
Pigeat P, Easwarakhanthan T, Briancon JL, Rinnert H
Thin Solid Films, 519(22), 8003, 2011 |
| 4 |
Spectroellipsometric investigation of optical, morphological, and structural properties of reactively sputtered polycrystalline AlN films
Easwarakhanthan T, Hussain SS, Pigeat P
Journal of Vacuum Science & Technology A, 28(3), 495, 2010 |
| 5 |
Substrate biasing effects on the microstructure of magnetron-sputtered AlN films investigated by in situ reflectance interferometry
Pigeat P, Easwarakhanthan T
Thin Solid Films, 516(12), 3957, 2008 |
| 6 |
Spectroellipsometric analysis of CHF3 plasma-polymerized fluorocarbon films
Easwarakhanthan T, Beyssen D, Le Brizoual L, Bougdira J
Journal of Vacuum Science & Technology A, 24(4), 1036, 2006 |
| 7 |
Comparison Between Newly Developed and Classical Determinations of Index and Thickness of Thin-Films on Substrates by Ellipsometry
Easwarakhanthan T, Remy M
Thin Solid Films, 280(1-2), 183, 1996 |
