화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 High sensitivity attenuated total reflection Fourier transform infrared spectroscopy study of ultrathin ZrO2 films: A study of phase change
Sayan S, Chandler-Horowitz D, Nguyen NV, Ehrstein JR
Journal of Vacuum Science & Technology A, 26(2), 270, 2008
2 Optical band gaps and composition dependence of hafnium-aluminate thin films grown by atomic layer chemical vapor deposition
Nguyen NV, Sayan S, Levin I, Ehrstein JR, Baumvol IJR, Driemeier C, Krug C, Wielunski L, Hung RY, Diebold A
Journal of Vacuum Science & Technology A, 23(6), 1706, 2005
3 Methodology for the Certification of Reference Specimens for Determination of Oxygen Concentration in Semiconductor Silicon by Infrared Spectrophotometry
Rennex BG, Ehrstein JR, Scace RI
Journal of the Electrochemical Society, 143(1), 258, 1996