검색결과 : 2건
No. | Article |
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1 |
Spectroscopic ellipsometry characterization of ZnO-In(2)O3 systems El Rhaleb H, Naciri AE, Dounia R, Johann L, Hakam A, Addou M Thin Solid Films, 455-56, 384, 2004 |
2 |
Spectroscopic ellipsometry studies of index profile of indium tin oxide films prepared by spray pyrolysis El Rhaleb H, Benamar E, Rami M, Roger JP, Hakam A, Ennaoui A Applied Surface Science, 201(1-4), 138, 2002 |