검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Moving toward simpler, highly functional multilateral completions Emerson AB, Westgard DJ Journal of Canadian Petroleum Technology, 41(5), 9, 2002 |
| 2 |
Surface-Analysis, Depth Profiling, and Evaluation of Si Cleaning Procedures by Postionization Sputtered Neutral Mass-Spectrometry Emerson AB, Ma Y, Wise ML, Green ML, Downey SW Journal of Vacuum Science & Technology B, 14(1), 301, 1996 |
| 3 |
Depth Profiling of Dopants in Thin Gate Oxides in Complementary Metal-Oxide-Semiconductor Structures by Resonance Ionization Mass-Spectrometry Downey SW, Emerson AB, Georgiou GE, Bevk J, Kistler RC, Moriya N, Jacobson DC, Wise ML Journal of Vacuum Science & Technology B, 13(2), 167, 1995 |