| 1 |
Method to Quantify Nanoscale Surface Charge in Liquid with Atomic Force Microscopy
Li L, Eppell SJ, Zypman FR
Langmuir, 36(15), 4123, 2020 |
| 2 |
Charge Calibration Standard for Atomic Force Microscope Tips in Liquids
Li L, Steinmetz NF, Eppell SJ, Zypman FR
Langmuir, 36(45), 13621, 2020 |
| 3 |
Obtaining Charge Distributions on Geometrically Generic Nanostructures Using Scanning Force Microscopy
Jarmusik KE, Eppell SJ, Lacks DJ, Zypman FR
Langmuir, 27(5), 1803, 2011 |
| 4 |
Probing the limits of the Derjaguin approximation with scanning force microscopy
Todd BA, Eppell SJ
Langmuir, 20(12), 4892, 2004 |
| 5 |
Analysis of scanning force microscope force-distance data beyond the Hookian approximation
Zypman FR, Eppell SJ
Journal of Vacuum Science & Technology B, 16(4), 2099, 1998 |
| 6 |
Electrostatic tip-surface interaction in scanning force microscopy : A convenient expression useful for arbitrary tip and sample geometries
Zypman FR, Eppell SJ
Journal of Vacuum Science & Technology B, 15(6), 1853, 1997 |
| 7 |
Morphological Modeling of Atomic-Force Microscopy Imaging Including Nanostructure Probes and Fibrinogen Molecules
Wilson DL, Dalal P, Kump KS, Benard W, Xue P, Marchant RE, Eppell SJ
Journal of Vacuum Science & Technology B, 14(4), 2407, 1996 |
| 8 |
Morphological Restoration of Atomic-Force Microscopy Images
Wilson DL, Kump KS, Eppell SJ, Marchant RE
Langmuir, 11(1), 265, 1995 |
