검색결과 : 1건
No. | Article |
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1 |
The effect of low dielectric polymer thickness on the electromigration characteristics of Al(1% Cu-0.5% Si) thin films Yoo S, Eun BS, Kim YH, Chung YC Thin Solid Films, 382(1-2), 222, 2001 |
No. | Article |
---|---|
1 |
The effect of low dielectric polymer thickness on the electromigration characteristics of Al(1% Cu-0.5% Si) thin films Yoo S, Eun BS, Kim YH, Chung YC Thin Solid Films, 382(1-2), 222, 2001 |