1 |
Using Electrochemistry - Total Internal Reflection Ellipsometry Technique to Observe the Dissolved Oxygen Reduction on Clark Electrode Liu W, Li M, Luo ZR, Jin G Electrochimica Acta, 142, 371, 2014 |
2 |
Evanescent-wave particle velocimetry measurements of zeta-potentials in fused-silica microchannels Cevheri N, Yoda M Electrophoresis, 34(13), 1950, 2013 |
3 |
Graphene-Based Waveguides: Novel Method for Detecting Biological Activity Kim J, Kasture M, Hwang T, Kulkarni A, Amin R, Park S, Kim T, Gosavi S Applied Biochemistry and Biotechnology, 167(5), 1069, 2012 |
4 |
Nanostructuring of alumina optical waveguides by hot water treatment for tuning sensor output Aslan MM Thin Solid Films, 520(6), 2251, 2012 |
5 |
Attenuated total reflectance spectroscopy of coumarin organosilane molecules adsorbed on a fused silica surface Bratescu MA, Saito N, Takai O Applied Surface Science, 257(5), 1792, 2010 |
6 |
Evaluation of Photoreactive Azo Dye Molecular Thin Films Utilizing an Optical Interferometer with Evanescent Wave Illumination Ohdaira Y, Banba K, Murotani K, Suzuki T, Sasaki O, Baba A, Shinbo K, Kato K, Kaneko F Molecular Crystals and Liquid Crystals, 504, 114, 2009 |
7 |
Response kinetics of a fiber-optic gas sensor using Pt/WO3 thin film to hydrogen Matsuyama N, Okazaki S, Nakagawa H, Sone H, Fukuda K Thin Solid Films, 517(16), 4650, 2009 |
8 |
Attenuated total reflectance spectroscopy of simultaneous processes: Corrosion inhibition of cuprous oxide by benzotriazole Bratescu MA, Allred DB, Saito N, Sarikaya M, Takai O Applied Surface Science, 254(10), 2960, 2008 |
9 |
Nanoscopic photodeposited structures analyzed by an evanescent optical method Socol G, Axente E, Oane M, Voicu L, Petris A, Vlad V, Mihailescu IN, Mirchin N, Margolin R, Naot D, Peled A Applied Surface Science, 253(15), 6535, 2007 |
10 |
Effect of the Pd-Au thin film thickness uniformity on the performance of an optical fiber hydrogen sensor Luna-Moreno D, Monzon-Hernandez D Applied Surface Science, 253(21), 8615, 2007 |