검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Data retention under gate stress on a NVM array Djenadi R, Micolau G, Postel-Pellerin J, Chiquet P, Laffont R, Ogier JL, Regnier A, Lalande F, Melkonian J Solid-State Electronics, 78, 80, 2012 |
| 2 |
An experimental method allowing quantifying and localizing failed cells of an EEPROM CAST after a retention test Le Roux C, Lopez L, Firiti A, Ogier JL, Lalande F, Laffont R, Micolau G Solid-State Electronics, 52(10), 1550, 2008 |