검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Accurate depth profiling of dry oxidized SiGeC thin films by extended Full Spectrum ToF-SIMS Py M, Saracco E, Damlencourt JF, Barnes JP, Fabbri JM, Hartmann JM Applied Surface Science, 257(22), 9414, 2011 |
| 2 |
Chemical and Structural Properties of a TaN/HfO2 Gate Stack Processed Using Atomic Vapor Deposition Gaumer C, Martinez E, Lhostis S, Wiemer C, Perego M, Loup V, Lafond D, Fabbri JM Journal of the Electrochemical Society, 156(7), G78, 2009 |