화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 Plasma doping two-dimensional characterization using low energy x-ray emission spectroscopy and full wafer secondary ion mass spectrometry/angle-resolved x-ray electron spectroscopy techniques
Qin S, Morinville W, Zhuang K, Fabreguette F, McTeer A, Hu YJ, Lu SF
Journal of Vacuum Science & Technology B, 28(1), C1D1, 2010
2 X-ray multiple diffraction in the characterization of TiNO and TiO2 thin films grown on Si(001)
Chiaramonte T, Abramof E, Fabreguette F, Sacilotti M, Cardoso LP
Applied Surface Science, 253(3), 1590, 2006
3 Structure and properties of GaNxOy films grown by nitridation of GaAs(100) substrates
de Lucas MCM, Fabreguette F, Linsavanh M, Imhoff L, Heintz O, Josse-Courty C, Mesnier MT, Potin V, Bourgeois S, Sacilotti M
Journal of Crystal Growth, 261(2-3), 324, 2004
4 Structural characterization of TiO2/TiNxOy (delta-doping) heterostructures on (110)TiO2 substrates
Chiaramonte T, Cardoso LP, Gelamo RV, Fabreguette F, Sacilotti M, de Lucas MCM, Imhoff L, Bourgeois S, Kihn Y, Casanove MJ
Applied Surface Science, 212, 661, 2003
5 Conductimetry and impedance spectroscopy study of low pressure metal organic chemical vapor deposition TiNxOy films as a function of the growth temperature: a percolation approach
Fabreguette F, Maglione M, Imhoff L, Domenichini B, de Lucas MCM, Sibillot P, Bourgeois S, Sacilotti M
Applied Surface Science, 175, 574, 2001
6 Structural and in depth characterization of newly designed conducting/insulating TiNxOy/TiO2 multilayers obtained by one step LP-MOCVD growth
Fabreguette F, Imhoff L, Heintz O, Maglione M, Domenichini B, de Lucas MCM, Sibillot P, Bourgeois S, Sacilotti M
Applied Surface Science, 175, 685, 2001
7 Amorphous TiO2 in LP-OMCVD TiNxOy thin films revealed by XPS
Guillot J, Fabreguette F, Imhoff L, Heintz O, de Lucas MCM, Sacilotti M, Domenichini B, Bourgeois S
Applied Surface Science, 177(4), 268, 2001
8 Structural characterization of TiNxOy/TiO2 single crystalline and nanometric multilayers grown by LP-MOCVD on (110)TiO2
Fabreguette F, Guillot J, Cardoso LP, Marcon R, Imhoff L, de Lucas MCM, Sibillot R, Bourgeois S, Dufour P, Sacilotti M
Thin Solid Films, 400(1-2), 125, 2001