검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Mastering the biaxial stress state in nanometric thin films on flexible substrates Faurie D, Renault PO, Le Bourhis E, Geandier G, Goudeau P, Thiaudiere D Applied Surface Science, 306, 70, 2014 |
| 2 |
Sin(2) psi analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure Faurie D, Geandier G, Renault PO, Le Bourhis E, Thiaudiere D Thin Solid Films, 530, 25, 2013 |
| 3 |
Deformation modes of nanostructured thin film under controlled biaxial deformation Djaziri S, Faurie D, Le Bourhis E, Goudeau P, Renault PO, Mocuta C, Thiaudiere D, Hild F Thin Solid Films, 530, 30, 2013 |
| 4 |
Non-equibiaxial deformation of W/Cu nanocomposite thin films on stretchable substrate: Effect of loading path Renault PO, Le Bourhis E, Goudeau P, Thiaudiere D, Faurie D Thin Solid Films, 549, 239, 2013 |
| 5 |
Time resolved synchrotron x-ray strain measurements of gold thin film on flexible substrate Faurie D, Renault PO, Geandier G, Le Bourhis E Thin Solid Films, 520(5), 1603, 2011 |
| 6 |
Strains, stresses and elastic properties in polycrystalline metallic thin films: in situ deformation combined with x-ray diffraction and simulation experiments Goudeau P, Faurie D, Girault B, Renault PO, Le Bourhis E, Villain P, Badawi F, Castelnau O, Brenner R, Bechade JL, Geandier G, Tamura N Materials Science Forum, 524-525, 735, 2006 |
| 7 |
Evolution under annealing and nitrogen implantation of the mechanical properties of amorphous carbon films Charvet S, Le Bourhis E, Faurie D, Goudeau P, Lejeune M, Gergaud P Thin Solid Films, 482(1-2), 318, 2005 |
| 8 |
TEM study of the indentation behaviour of thin Au film on GaAs Patriarche G, Le Bourhis E, Faurie D, Renault PO Thin Solid Films, 460(1-2), 150, 2004 |
| 9 |
Measurement of thin film elastic constants by X-ray diffraction Faurie D, Renault PO, Le Bourhis E, Villain P, Goudeau P, Badawi F Thin Solid Films, 469-470, 201, 2004 |
| 10 |
Structural and mechanical properties of stainless steel thin films elaborated by thermal evaporation and ion beam sputtering Goudeau P, Merakeb N, Eymery P, Faurie D, Boubeker B, Bouzabata B Materials Science Forum, 426-4, 3451, 2003 |