검색결과 : 2건
No. | Article |
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1 |
Dissolution of extended defects in strained silicon Moroz V, Martin-Bragado I, Felch S, Nouri F, Olsen C, Jones KS Journal of Vacuum Science & Technology B, 26(1), 439, 2008 |
2 |
Formation of p(+) shallow junctions using SiGe barriers Thompson PE, Crosby R, Bennett J, Felch S Journal of Vacuum Science & Technology B, 22(5), 2333, 2004 |