검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
The simultaneous determination of n, k, and t from polarimetric data Flock K Thin Solid Films, 455-56, 349, 2004 |
| 2 |
Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition Flock K, Kim SJ, Asar M, Kim IK, Aspnes DE Thin Solid Films, 455-56, 639, 2004 |
| 3 |
Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition Bell KA, Ebert M, Yoo SD, Flock K, Aspnes DE Journal of Vacuum Science & Technology A, 18(4), 1184, 2000 |
| 4 |
In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy Ebert M, Bell KA, Yoo SD, Flock K, Aspnes DE Thin Solid Films, 364(1-2), 22, 2000 |