검색결과 : 19건
| No. | Article |
|---|---|
| 1 |
Inactivation and structural alteration of alpha-amylase by low-pressure carbon dioxide microbubbles Kobayashi F, Nakajima R, Narai-Kanayama A, Odake S Process Biochemistry, 88, 60, 2020 |
| 2 |
CATALYTIC ACTIVITY OF AN Al-CI-RE SYSTEM FOR n-HEXANE CRACKING Lakhova AI, Valieva GR, Valieva AA, Karalin EA, Petrov SM, Bashkirtseva NY Chemistry and Technology of Fuels and Oils, 55(1), 1, 2019 |
| 3 |
Profiling of inorganic elements in coal seams using laboratory-based core scanning X-ray fluorescence techniques Ward CR, Kelloway SJ, French D, Wainwright IE, Marjo C, Cohen DR International Journal of Coal Geology, 191, 158, 2018 |
| 4 |
Investigating the intersystem crossing rate and triplet quantum yield of Protoporphyrin IX by means of pulse train fluorescence technique Gotardo F, Cocca LHZ, Acunha TV, Longoni A, Toldo J, Goncalves PFB, Iglesias BA, De Boni L Chemical Physics Letters, 674, 48, 2017 |
| 5 |
Morphological control of tranilast attached to carrier particles by amino acid addition Nishimura T, Kadota K, Kunita A, Nakayama Y, Tagishi H, Tozuka Y Advanced Powder Technology, 27(3), 971, 2016 |
| 6 |
Investigation on unidirectional growth of 1,3,5-Triphenylbenzene by Sankaranarayanan-Ramasamy method and its characterization of lifetime, thermal analysis, hardness and etching studies Durairaj N, Kalainathan S, Krishnaiah MV Materials Chemistry and Physics, 181, 529, 2016 |
| 7 |
Molecularly imprinted polymer coating with fluorescence on magnetic particle Huang J, Liu H, Men H, Zhai Y, XI Q, Zhang Z, Zhang J, Yin Z, Li L Macromolecular Research, 21(9), 1021, 2013 |
| 8 |
Selective Chemical Vapor Deposition-Grown Ru for Cu Interconnect Capping Applications Yang CC, McFeely FR, Wang PC, Chanda K, Edelstein DC Electrochemical and Solid State Letters, 13(5), D33, 2010 |
| 9 |
Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon Pepponi G, Giubertoni D, Bersani M, Meirer F, Ingerle D, Steinhauser G, Streli C, Hoenicke P, Beckhoff B Journal of Vacuum Science & Technology B, 28(1), C1C59, 2010 |
| 10 |
Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques Giubertoni D, Iacob E, Hoenicke P, Beckhoff B, Pepponi G, Gennaro S, Bersani M Journal of Vacuum Science & Technology B, 28(1), C1C84, 2010 |