| 1 |
Resistivity of epitaxial copper nanolines with trapezoidal cross-section
Lu ZH, Frey DM, Merkh T, Lord R, Washington MA, Lu TM
Thin Solid Films, 599, 187, 2016 |
| 2 |
Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling
Cui AJ, Liu Z, Dong HL, Wang YJ, Zhen YG, Li WX, Li JJ, Gu CZ, Hu WP
Advanced Materials, 27(19), 3002, 2015 |
| 3 |
Focused ion beam (FIB)-induced changes in the electrochemical behavior of boron-doped diamond (BDD) electrodes
Eifert A, Langenwalter P, Higl J, Linden M, Nebel CE, Mizaikoff B, Kranz C
Electrochimica Acta, 130, 418, 2014 |
| 4 |
Characterization of impedance biosensing performance of single and nanopore arrays of anodic porous alumina fabricated by focused ion beam (FIB) milling
Kant K, Priest C, Shapter JG, Losic D
Electrochimica Acta, 139, 225, 2014 |
| 5 |
A critical comparison between XRD and FIB residual stressmeasurement techniques in thin films
Bemporad E, Brisotto M, Depero LE, Gelfi M, Korsunsky AM, Lunt AJG, Sebastiani M
Thin Solid Films, 572, 224, 2014 |
| 6 |
Characterization of the magnetic properties of a GdBa2Cu3O7/La0.75Sr0.25MnO3 superlattice using off-axis electron holography
Kasama T, Moreno MS, Dunin-Borkowski RE, Newcomb SB, Haberkorn N, Guimpel J, Midgley PA
Applied Surface Science, 252(11), 3977, 2006 |
