화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Laser ablation in water: A route to synthesize nanoparticles of titanium monoxide
Semaltianos NG, Logothetidis S, Frangis N, Tsiaoussis I, Perrie W, Dearden G, Watkins KG
Chemical Physics Letters, 496(1-3), 113, 2010
2 Study of the growth of inorganic and organic electrodes onto polyethylene terephthalate substrates
Garganourakis M, Logothetidis S, Pitsalidis C, Hastas NA, Breza K, Laskarakis A, Frangis N
Thin Solid Films, 518(4), 1124, 2009
3 Microstructural investigation of 3C-SiC islands grown by VLS mechanism on 6H-SiC substrate
Andreadou A, Soueidan M, Tsiaoussis I, Polychroniadis EK, Ferro G, Frangis N
Journal of Crystal Growth, 310(7-9), 1799, 2008
4 The growth of Pd thin films on a 6H-SiC(0001) substrate
Tsiaoussis I, Frangis N, Manolikas C, Tan TAN
Journal of Crystal Growth, 300(2), 368, 2007
5 High-resolution electron microscopy study of SiGeC thin films grown on Si(100) by laser-assisted techniques
Lioutas CB, Frangis N, Soumelidis S, Chiussi S, Lopez E, Leon B
Applied Surface Science, 252(13), 4527, 2006
6 Characterization of Si nanocrystals into SiO2 matrix
Gravalidis C, Logothetidis S, Hatziaras N, Laskarakis A, Tsiaoussis I, Frangis N
Applied Surface Science, 253(1), 385, 2006
7 Nanostructuring, compositional fluctuations, and atomic ordering in the thermoelectric materials AgPbmSbTe2+m. The myth of solid solutions
Quarez E, Hsu KF, Pcionek R, Frangis N, Polychroniadis EK, Kanatzidis MG
Journal of the American Chemical Society, 127(25), 9177, 2005
8 Deposition of hydroxyapatite thin films by Nd : YAG laser ablation: a microstructural study
Nistor LC, Ghica C, Teodorescu VS, Nistor SV, Dinescu M, Matei D, Frangis N, Vouroutzis N, Liutas C
Materials Research Bulletin, 39(13), 2089, 2004
9 Electron-Microscopy Characterization of Tin Films on Si, Grown by DC-Reactive Magnetron Sputtering
Pecz B, Frangis N, Logothetidis S, Alexandrou I, Barna PB, Stoemenos J
Thin Solid Films, 268(1-2), 57, 1995
10 Titanium Disilicide on Silicon by Interdiffusion of Titanium and Amorphous-Silicon Multilayers - Transmission Electron-Microscopy, Spectroscopic Ellipsometry and Resistivity Measurements
Nassiopoulos AG, Tambouris D, Frangis N, Logothetidis S, Georga S, Krontiras C, Xanthopoulos N
Thin Solid Films, 247(1), 44, 1994