검색결과 : 1건
No. | Article |
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1 |
Defect analysis for patterned media Ye ZM, Fretwell J, Luo K, Ha S, Schmid G, LaBrake D, Resnick DJ, Sreenivasan SV Journal of Vacuum Science & Technology B, 28(6), C6M7, 2010 |
No. | Article |
---|---|
1 |
Defect analysis for patterned media Ye ZM, Fretwell J, Luo K, Ha S, Schmid G, LaBrake D, Resnick DJ, Sreenivasan SV Journal of Vacuum Science & Technology B, 28(6), C6M7, 2010 |