검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Analysis of the Depth Homogeneity of P-PS by Reflectance Measurements Thonissen M, Berger MG, Billat S, Arensfischer R, Kruger M, Luth H, Theiss W, Hillbrich S, Grosse P, Lerondel G, Frotscher U Thin Solid Films, 297(1-2), 92, 1997 |
| 2 |
Investigation of Different Oxidation Processes for Porous Silicon Studied by Spectroscopic Ellipsometry Frotscher U, Rossow U, Ebert M, Pietryga C, Richter W, Berger MG, Arensfischer R, Munder H Thin Solid Films, 276(1-2), 36, 1996 |
| 3 |
Influence of the Formation Conditions on the Microstructure of Porous Silicon Layers Studied by Spectroscopic Ellipsometry Rossow U, Frotscher U, Thonissen M, Berger MG, Frohnhoff S, Munder H, Richter W Thin Solid Films, 255(1-2), 5, 1995 |