검색결과 : 17건
No. | Article |
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1 |
Material parameters from frequency dispersion simulation of floating gate memory with Ge nanocrystals in HfO2 Palade C, Lepadatu AM, Slav A, Lazanu S, Teodorescu VS, Stoica T, Ciurea ML Applied Surface Science, 428, 698, 2018 |
2 |
Mn-doping effects on structural and magnetic properties of Ge nanocrystals on insulator Aouassa M, Zrir MA, Jadli I, Bandyopadhyay AK, Karaman I, Panczer G, Maaref H Applied Surface Science, 428, 1056, 2018 |
3 |
Charging behavior of silicon nitride based non-volatile memory structures with embedded semiconductor nanocrystals Horvath ZJ, Basa P, Jaszi T, Molnar KZ, Pap AE, Molnar G Applied Surface Science, 269, 23, 2013 |
4 |
Annealing temperature effect on structure and electrical properties of films formed of Ge nanoparticles in SiO2 Stavarache I, Lepadatu AM, Stoica T, Ciurea ML Applied Surface Science, 285, 175, 2013 |
5 |
Size dependent charge storage characteristics of MBE grown Ge nanocrystals on surface oxidized Si Aluguri R, Das S, Singha RK, Ray SK Current Applied Physics, 13(1), 12, 2013 |
6 |
Ge nanocrystals in HfO2/SiN dielectric stacks by low energy ion beam synthesis Carrada M, Sahu BS, Bonafos C, Gloux F, Groenen J, Muller D, Slaoui A Thin Solid Films, 543, 94, 2013 |
7 |
Electrical characteristics of MIS capacitors with multi-stack thermal-agglomerating Ge nanocrystals in SiO2/SiNx dielectrics Lo SY, Peng CW, Hong JW Solid-State Electronics, 53(11), 1186, 2009 |
8 |
Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals Basa P, Alagoz AS, Lohner T, Kulakci M, Turan R, Nagy K, Horvath ZJ Applied Surface Science, 254(12), 3626, 2008 |
9 |
Fabrication of multilayered Ge nanocrystals embedded in SiOxGeNy films Gao F, Green MA, Conibeer G, Cho EC, Huang Y, Perez-Wurfl I, Flynn C Applied Surface Science, 254(22), 7527, 2008 |
10 |
Ellipsometric study of crystallization of amorphous Ge thin films embedded in SiO2 Alonso MI, Garriga M, Bernardi A, Goni AR, Lopeandia AF, Garcia G, Rodriguez-Viejo J, Labar U Thin Solid Films, 516(12), 4277, 2008 |