화학공학소재연구정보센터
검색결과 : 16건
No. Article
1 Versatile protein-based bifunctional nano-systems (encapsulation and directed assembly): Selective nanoscale positioning of gold nanoparticle-viral protein hybrids
Zheng B, Zettsu N, Fukuta M, Uenuma M, Hashimoto T, Gamo K, Uraoka Y, Yamashita I, Watanabe H
Chemical Physics Letters, 506(1-3), 76, 2011
2 Removal of phenolic endocrine disruptors by Portulaca oleracea
Imai S, Shiraishi A, Gamo K, Watanabe I, Okuhata H, Miyasaka H, Ikeda K, Bamba T, Hirata K
Journal of Bioscience and Bioengineering, 103(5), 420, 2007
3 Direct fabrication of nano-gap electrodes by focused ion beam etching
Nagase T, Gamo K, Kubota T, Mashiko S
Thin Solid Films, 499(1-2), 279, 2006
4 Novel electron-beam molecular resists with high resolution and high sensitivity for nanometer lithography
Kadota T, Kageyama H, Wakaya F, Gamo K, Shirota Y
Chemistry Letters, 33(6), 706, 2004
5 Formation of GaN films by Ga ion direct deposition under nitrogen radical atmosphere
Toda M, Yanagisawa J, Gamo K, Akasaka Y
Journal of Vacuum Science & Technology B, 22(6), 3012, 2004
6 Fabrication of spin-current-induced domain-wall-nucleation device in planar configuration
Kimura T, Wakaya F, Gamo K
Journal of Vacuum Science & Technology B, 20(6), 2814, 2002
7 Carrier profiles and electron traps at a growth-interrupted layer in GaAs fabricated by a focused ion beam and molecular beam epitaxy combined system
Goto T, Hada T, Yanagisawa J, Wakaya F, Yuba Y, Gamo K
Applied Surface Science, 159, 277, 2000
8 Carrier distribution profiles in Si-doped layers in GaAs formed by focused ion beam implantation and successive overlayer growth
Hada T, Goto T, Yanagisawa J, Wakaya F, Yuba Y, Gamo K
Journal of Vacuum Science & Technology B, 18(6), 3158, 2000
9 Carrier profile of the Si-doped layer in GaAs fabricated by a low-energy focused ion beam/molecular beam epitaxy combined system
Yanagisawa J, Goto T, Hada T, Nakai M, Wakaya F, Yuba Y, Gamo K
Journal of Vacuum Science & Technology B, 17(6), 3072, 1999
10 Interface states induced in GaAs by growth interruption during an in situ process
Wakaya F, Matsubara T, Nakayama M, Yanagisawa J, Yuba Y, Takaoka S, Murase K, Gamo K
Journal of Vacuum Science & Technology B, 16(4), 2313, 1998