검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs Kilchytska V, Alvarado J, Collaert N, Rooyackers R, Put S, Simoen E, Claeys C, Flandre D Solid-State Electronics, 59(1), 18, 2011 |