화학공학소재연구정보센터
검색결과 : 9건
No. Article
1 Local strain redistribution in a coarse-grained nickel-based superalloy subjected to shot-peening, fatigue or thermal exposure investigated using synchrotron X-ray Laue microdiffraction
Altinkurt G, Fevre M, Geandier G, Dehmas M, Robach O, Micha JS
Journal of Materials Science, 53(11), 8567, 2018
2 Mastering the biaxial stress state in nanometric thin films on flexible substrates
Faurie D, Renault PO, Le Bourhis E, Geandier G, Goudeau P, Thiaudiere D
Applied Surface Science, 306, 70, 2014
3 Sin(2) psi analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure
Faurie D, Geandier G, Renault PO, Le Bourhis E, Thiaudiere D
Thin Solid Films, 530, 25, 2013
4 In situ thermal residual stress evolution in ultrathin ZnO and Ag films studied by synchrotron x-ray diffraction
Renault PO, Krauss C, Le Bourhis E, Geandier G, Benedetto A, Grachev SY, Barthel E
Thin Solid Films, 520(5), 1390, 2011
5 Time resolved synchrotron x-ray strain measurements of gold thin film on flexible substrate
Faurie D, Renault PO, Geandier G, Le Bourhis E
Thin Solid Films, 520(5), 1603, 2011
6 Characterization and modelling of the elastic properties of nano-structured W/Cu multilayers
Castelnau O, Geandier G, Renault PO, Goudeau P, Le Bourhis E
Thin Solid Films, 516(2-4), 320, 2007
7 White beam microdiffraction experiments for the determination of the local plastic behaviour of polycrystals
Castelnau O, Goudeau P, Geandier G, Tamura N, Bechade JL, Bornert M, Caldemaison D
Materials Science Forum, 524-525, 103, 2006
8 Strains, stresses and elastic properties in polycrystalline metallic thin films: in situ deformation combined with x-ray diffraction and simulation experiments
Goudeau P, Faurie D, Girault B, Renault PO, Le Bourhis E, Villain P, Badawi F, Castelnau O, Brenner R, Bechade JL, Geandier G, Tamura N
Materials Science Forum, 524-525, 735, 2006
9 X-ray diffraction analysis of residual stresses in alumina-chromium composites and comparison with numerical simulations
Geandier G, Weisbecker P, Denis S, Hazotte A, Mocellin A, Lebrun JL, Elkaim E
Materials Science Forum, 404-7, 547, 2002