검색결과 : 17건
| No. | Article |
|---|---|
| 1 |
Role of electric field and electrode material on the improvement of the ageing effects in hydrogenated amorphous silicon solar cells Scuto A, Valenti L, Pierro S, Foti M, Gerardi C, Battaglia A, Lombardo S Solar Energy Materials and Solar Cells, 141, 203, 2015 |
| 2 |
Nanoscale structuration and optical properties of thin gold films on textured FTO Gentile A, Cacciato G, Ruffino F, Reitano R, Scapellato G, Zimbone M, Lombardo S, Battaglia A, Gerardi C, Foti M, Grimaldi MG Journal of Materials Science, 49(24), 8498, 2014 |
| 3 |
Efficient flexible thin film silicon module on plastics for indoor energy harvesting Foti M, Tringali C, Battaglia A, Sparta N, Lombardo S, Gerardi C Solar Energy Materials and Solar Cells, 130, 490, 2014 |
| 4 |
Comparison between textured SnO2:F and Mo contacts with the p-type layer in p-i-n hydrogenate amorphous silicon solar cells by forward bias impedance analysis Cannella G, Principato F, Foti M, Gerardi C, Lombardo S Solar Energy, 88, 175, 2013 |
| 5 |
Study of bubble growth in water pool boiling through synchronized, infrared thermometry and high-speed video Gerardi C, Buongiorno J, Hu LW, McKrell T International Journal of Heat and Mass Transfer, 53(19-20), 4185, 2010 |
| 6 |
Multiple gate NVM cells with improved Fowler-Nordheim tunneling program and erase performances Gerardi C, Tripiciano E, Cina G, Lombardo S, Garozzo C, Corso D, Betro G, Pace C, Crupi F Solid-State Electronics, 54(11), 1319, 2010 |
| 7 |
Nanocrystal memories for FLASH device applications Ammendola G, Ancarani V, Triolo V, Bileci M, Corso D, Crupi I, Perniola L, Gerardi C, Lombardo S, DeSalvo B Solid-State Electronics, 48(9), 1483, 2004 |
| 8 |
Study of nanocrystal memory reliability by CAST structures Compagnoni CM, Ielmini D, Spinelli AS, Lacaita AL, Gerardi C Solid-State Electronics, 48(9), 1497, 2004 |
| 9 |
Growth and characterization of LPCVD Si quantum dots on insulators Baron T, Mazen F, Hartmann JM, Mur P, Puglisi RA, Lombardo S, Ammendola G, Gerardi C Solid-State Electronics, 48(9), 1503, 2004 |
| 10 |
TOF-SIMS study of adhesive residuals on device contact pads after wafer taping and backgrinding Lazzeri P, Franco G, Garozzo M, Gerardi C, Iacob E, Lo Faro A, Privitera A, Vanzetti L, Bersani M Applied Surface Science, 203, 445, 2003 |