검색결과 : 19건
| No. | Article |
|---|---|
| 1 |
Electrochemical Characterization of Thin Film Electrodes Toward Developing a DNA Transistor Harrer S, Ahmed S, Afzali-Ardakani A, Luan BQ, Waggoner PS, Shao XY, Peng HB, Goldfarb DL, Martyna GJ, Rossnagel SM, Deligianni L, Stolovitzky GA Langmuir, 26(24), 19191, 2010 |
| 2 |
Measurements of acid generation by extreme ultraviolet irradiation in lithographic films Glodde M, Goldfarb DL, Medeiros DR, Wallraff GM, Denbeaux GP Journal of Vacuum Science & Technology B, 25(6), 2496, 2007 |
| 3 |
X-ray absorption spectroscopy to probe surface composition and surface deprotection in photoresist films Lenhart JL, Fischer DA, Sambasivan S, Lin EK, Jones RL, Soles CL, Wu WL, Goldfarb DL, Angelopoulos M Langmuir, 21(9), 4007, 2005 |
| 4 |
Direct measurement of the counterion distribution within swollen polyelectrolyte films Prabhu VM, Vogt BD, Wu WL, Douglas JF, Lin EK, Satija SK, Goldfarb DL, Ito H Langmuir, 21(15), 6647, 2005 |
| 5 |
Electrical conductivity of decamethylferrocenium hexafluorophosphate and tetrabutylammonium hexafluorophosphate in supercritical trifluoromethane Goldfarb DL, Corti HR Journal of Physical Chemistry B, 108(10), 3358, 2004 |
| 6 |
Diffusion of decamethylferrocene and decamethylferrocenium hexafluorophosphate in supercritical trifluoromethane Goldfarb DL, Corti HR Journal of Physical Chemistry B, 108(10), 3368, 2004 |
| 7 |
Formation of deprotected fuzzy blobs in chemically amplified resists Jones RL, Hu TJ, Lin EK, Wu WL, Goldfarb DL, Angelopoulos M, Trinque BC, Schmid GM, Stewart MD, Willson CG Journal of Polymer Science Part B: Polymer Physics, 42(17), 3063, 2004 |
| 8 |
Effect of thin-film imaging on line edge roughness transfer to underlayers during etch processes Goldfarb DL, Mahorowala AP, Gallatin GM, Petrillo KE, Temple K, Angelopoulos M, Rasgon S, Sawin HH, Allen SD, Lawson MC, Kwong RW Journal of Vacuum Science & Technology B, 22(2), 647, 2004 |
| 9 |
Interfacial effects on moisture absorption in thin polymer films Vogt BD, Soles CL, Jones RL, Wang CY, Lin EK, Wu WL, Satija SK, Goldfarb DL, Angelopoulos M Langmuir, 20(13), 5285, 2004 |
| 10 |
Near edge x-ray absorption fine structure measurements of surface segregation in 157 nm photoresist blends Jablonski EL, Prabhu VM, Sambasivan S, Lin EK, Fischer DA, Goldfarb DL, Angelopoulos M, Ito H Journal of Vacuum Science & Technology B, 21(6), 3162, 2003 |