검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Conformers of Ubiquitin 6+for Different Charge Distributions: Atomistic Structures and Ion Mobility Cross Sections Gantman T, Goldstein M, Segev E, Gerber RB Journal of Physical Chemistry B, 123(30), 6401, 2019 |
| 2 |
Highly structured slow solar wind emerging from an equatorial coronal hole Bale SD, Badman ST, Bonnell JW, Bowen TA, Burgess D, Case AW, Cattell CA, Chandran BDG, Chaston CC, Chen CHK, Drake JF, De Wit TD, Eastwood JP, Ergun RE, Farrell WM, Fong C, Goetz K, Goldstein M, Goodrich KA, Harvey PR, Horbury TS, Howes GG, Kasper JC, Kellogg PJ, Klimchuk JA, Korreck KE, Krasnoselskikh VV, Krucker S, Laker R, Larson DE, MacDowall RJ, Maksimovic M, Malaspina DM, Martinez-Oliveros J, McComas DJ, Meyer-Vernet N, Moncuquet M, Mozer FS, Phan TD, Pulupa M, Raouafi NE, Salem C, Stansby D, Stevens M, Szabo A, Velli M, Woolley T, Wygant JR Nature, 576(7786), 237, 2019 |
| 3 |
Tribological, Thermal and Kinetic Attributes of 300 vs. 450 mm Chemical Mechanical Planarization Processes Jiao YB, Liao XY, Wu CH, Theng S, Zhuang Y, Sampurno Y, Goldstein M, Philipossian A Journal of the Electrochemical Society, 159(3), H255, 2012 |
| 4 |
Pushing extreme ultraviolet lithography development beyond 22 nm half pitch Naulleau PP, Anderson CN, Baclea-an LM, Denham P, George S, Goldberg KA, Goldstein M, Hoef B, Jones G, Koh C, La Fontaine B, Montgomery W, Wallow T Journal of Vacuum Science & Technology B, 27(6), 2911, 2009 |
| 5 |
Feasibility of real-time detection of abnormality in inter layer dielectric slurry during chemical mechanical planarization using frictional analysis Sampurno Y, Sudargho F, Zhuang Y, Goldstein M, Philipossian A Thin Solid Films, 516(21), 7667, 2008 |
| 6 |
Nanoconfinement and the glass transition: A cluster hypothesis Goldstein M Journal of Physical Chemistry B, 110(20), 9772, 2006 |
| 7 |
The Kauzmann paradox at constant volume Goldstein M Journal of Physical Chemistry B, 110(24), 12080, 2006 |
| 8 |
Test methods for measuring bulk copper and nickel in heavily doped p-type silicon wafers Fabry L, Hoelzl R, Andrukhiv A, Matsumoto K, Qiu J, Koveshnikov S, Goldstein M, Grabau A, Horie H, Takeda R Journal of the Electrochemical Society, 153(6), G566, 2006 |
| 9 |
Boost competitiveness via six sigma Deshpande PB, Makker SL, Goldstein M Chemical Engineering Progress, 95(9), 65, 1999 |