검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Impact of processing parameters on leakage current and defect behavior of n(+)p silicon junction diodes Gramenova E, Jansen P, Simoen E, Vanhellemont J, Dupas L, Deferm L Journal of the Electrochemical Society, 146(1), 359, 1999 |