| 1 |
Atomic-scale study of the role of carbon on boron clustering
Philippe T, Duguay S, Grob JJ, Mathiot D, Blavette D
Thin Solid Films, 518(9), 2406, 2010 |
| 2 |
Application of spectroscopic ellipsometry to the investigation of the optical properties of cobalt-nanostructured silica thin layers
Gilliot M, Naciri AE, Johann L, d'Orleans C, Muller D, Stoquert JP, Grob JJ
Applied Surface Science, 253(1), 389, 2006 |
| 3 |
ZnTe precipitates formed in SiO2 by sequential implantation of Zn+ and Te+ ions
Chemam R, Grob JJ, Bouabellou A, Muller D
Catalysis Today, 113(3-4), 215, 2006 |
| 4 |
As-doping effect on magnetic, optical and transport properties of Zn0.9Co0.1O diluted magnetic semiconductor
Ndilimabaka H, Colis S, Schmerber G, Muller D, Grob JJ, Gravier L, Jan C, Beaurepaire E, Dinia A
Chemical Physics Letters, 421(1-3), 184, 2006 |
| 5 |
Correlation between silicon nanocrystalline size effect and spectroscopic ellipsometry responses
Naciri AE, Mansour A, Johann L, Grob JJ, Eckert C
Thin Solid Films, 455-56, 486, 2004 |
| 6 |
Structural characteristics of copper/hydrogenated amorphous carbon composite films prepared by microwave plasma-assisted deposition processes from methane-argon and acetylene-argon gas mixtures
Thiery F, Pauleau Y, Grob JJ, Babonneau D
Thin Solid Films, 466(1-2), 10, 2004 |
| 7 |
Strain Compensation in Si1-X-Ygexcy Layers Prepared by Ion-Implantation and Excimer-Laser Annealing
Grob A, Grob JJ, Muller D, Prevot B, Stuck R
Thin Solid Films, 294(1-2), 145, 1997 |
| 8 |
Preparation of Si1-xGex Thin Crystalline Films by Pulsed Excimer-Laser Annealing of Heavily Ge Implanted Si
Repplinger F, Fogarassy E, Grob A, Grob JJ, Muller D, Prevot B, Stoquert JP, Deunamuno S
Thin Solid Films, 241(1-2), 155, 1994 |
